Characterization of High Tc Materials and Devices by Electron Microscopy
English | ISBN: 052155490X | 2000 | PDF | 406 pages | 13,4 mb
This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.
Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques and microanalysis by scanning transmission electron microscopy.